1. High precision implementation of Steck's recursion method for use in goodness-of-fit tests.
- Author
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Wang, Jiefei and Miecznikowski, Jeffrey C.
- Subjects
ORDER statistics ,STATISTICAL sampling ,GOODNESS-of-fit tests ,PARAMETRIC modeling - Abstract
Classical continuous goodness-of-fit (GOF) testing is employed for examining whether the data come from an assumed parametric model. In many cases, GOF tests assume a uniform null distribution and examine extreme values of the order statistics of the samples. Many of these statistics can be expressed by a function of the order statistics and the p-values amount to a joint probability statement based on the uniform order statistics. In this paper, we utilize Steck's recursion method and propose two high precision computing algorithms to compute the p-values for these GOF statistics. The numerical difficulties in implementing Steck's method are discussed and compared with solutions provided in high precision libraries. [ABSTRACT FROM AUTHOR]
- Published
- 2022
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