1. Spin-dependent recombination electron paramagnetic resonance spectroscopy of defects in irradiated silicon detectors
- Author
-
E. M. Verbitskaya, T. O. Niinikoski, V. Eremin, M. P. Vlasenko, Leonid S. Vlasenko, D. S. Poloskin, and R. Laiho
- Subjects
Silicon ,Chemistry ,General Physics and Astronomy ,chemistry.chemical_element ,law.invention ,law ,Excited state ,Vacancy defect ,Atom ,Atomic physics ,Triplet state ,Spectroscopy ,Electron paramagnetic resonance ,Diode - Abstract
Spin-dependent recombination (SDR) electron paramagnetic resonance (EPR) spectroscopy is applied for investigation of paramagnetic recombination centers in irradiated silicon p−n junction detectors (diodes) formed on float-zone (FZ) silicon wafers. The main radiation defects, associated with SRD-EPR spectra arising from excited triplet states, are assigned to complexes of two substitutional carbon atoms and one interstitial silicon atom (CS+SiI+CS) and to oxygen + vacancy (O+V) complexes (A-centers). In spite of the low concentration of oxygen in FZ silicon the A-centers are found to play an important role in the recombination process in the diodes. At temperatures T
- Published
- 2003
- Full Text
- View/download PDF