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Recent x-ray and neutron scattering studies have revealed static diffuse scattering due to polarons in the paramagnetic phase of the colossal magnetoresistive manganites La2-2xSr1+2xMn2O7, with x = 0.40 and 0.44. We show that the polarons exhibit short-range incommensurate correlations that grow with decreasing temperature, but disappear abruptly at the combined ferromagnetic and metal-insulator transition in the x = 0.40 system because of the sudden charge delocalization, while persisting at low temperature in the antiferromagnetic x = 0.44 system. The "melting" of the polaron ordering as we cool through T-C occurs with the collapse of the polaron scattering itself in the x = 0.40 system. This short-range polaron order is characterized by an ordering wave vector q = (0.3,0,1) that is almost independent of x for x greater than or equal to 0.38, and is consistent with a model of disordered stripes. (C) 2001 American Institute of Physics.

A series of buried CoSi2 layers prepared by a modified molecular beam epitaxy process (allotaxy) and a subsequent wet-oxidation process was investigated by x-ray scattering. The oxidation time which determines the depth in which the CoSi2 layers are located within the Si substrates has been varied during the preparation. The electron density profiles and the structure of the interfaces were extracted from specular reflectivity and diffuse scattering measurements. Crystal truncation rod investigations yielded the structure on an atomic level (crystalline quality). It turns out that the roughness of the CoSi2 layers increases drastically with increasing oxidation time, i.e., with increasing depth of the buried layers. Furthermore, the x-ray data reveal that the oxidation growth process is diffusion limited. (C) 2000 American Institute of Physics. [S0021-8979(00)00901-4].

Journal of applied physics 113, 064302 (2013). doi:10.1063/1.4790712, Published by American Institute of Physics, Melville, NY