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We investigate the properties and characteristics of planar Ti/TiOx/Ti junctions, which consist of transverse TiOx lines drawn on Ti test patterns. Junctions are elaborated by means of local anodic oxidation using atomic force microscopy. An irreversible morphological transformation occurring in a reproducible manner is observed when these planar junctions are electrically stressed under ambient atmosphere. Structural and chemical analyses based on transmission electron microscopy techniques reveal the extension of the initial amorphous TiOx into a crystalline rutile phase. This irreversible transformation is proven to vanish completely if the electrical stress occurs under vacuum atmosphere. Finally, we carry out temperature dependent electrical measurements in order to elucidate their conduction mechanism: Schottky emission above an ultra-low potential barrier is assumed to dominate under vacuum atmosphere whereas ionic conduction seems to prevail in air. [ABSTRACT FROM AUTHOR]

The development of devices that combine a magnetic material with a semiconductor chip is a major focus of current research. Barium hexaferrite (BaFe[SUB12]O[SUB19] or BaM) thick films are deposited here using a rf sputtering system. The films are amorphous and nonmagnetic after deposition. Postdeposition thermal annealings are employed to obtain magnetic properties. The effects of the substrate, thermal annealing and thickness of BaM on the magnetic properties are studied using a vibrating sample magnetometer. The initial results show good magnetic properties for the two subtrates studied and after thermal annealing above 800°C. The magnetic properties of the thick films are close to the bulk (BaM) ones. [ABSTRACT FROM AUTHOR]

Investigates the structural, electrical and piezoresistive properties of in situ boron-doped thin silicon layers deposited by plasma-enhanced chemical-vapor deposition on oxidized silicon substrates and subjected to a rapid thermal anneal. Sample preparation and experimental methods; Stress and structure of the films; Effect of doping on optical properties.