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25 results on '"Kai Nordlund"'

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1. Modelling of crater formation on anode surface by high-current vacuum arcs.

2. Ion ranges and irradiation-induced defects in multiwalled carbon nanotubes

3. Simulations of dynamical stabilization of Ag–Cu nanocomposites by ion-beam processing

4. Molecular dynamics simulations of CH3 sticking on carbon surfaces

5. Diffuse x-ray scattering from 311 defects in Si

6. Local segregation versus irradiation effects in high-entropy alloys: Steady-state conditions in a driven system

7. Atomistic simulation of diffuse x-ray scattering from defects in solids

8. Mechanisms of ion beam mixing in metals and semiconductors

9. Reduced chemical sputtering of carbon by silicon doping

10. Ion and electron irradiation-induced effects in nanostructured materials

11. Orientation dependent annealing kinetics of ion tracks in c-SiO2

12. Conditions for forming composite carbon nanotube-diamond like carbon material that retain the good properties of both materials

13. Tensile testing of Fe and FeCr nanowires using molecular dynamics simulations

14. Atomistic simulation of Er irradiation induced defects in GaN nanowires

15. Investigation of the thermal stability of Cu nanowires using atomistic simulations

16. Effects of defect clustering on optical properties of GaN by single and molecular ion irradiation

17. Atomistic simulation of damage production by atomic and molecular ion irradiation in GaN

18. Nanoscale density fluctuations in swift heavy ion irradiated amorphous SiO2

19. Enhancement of irradiation-induced defect production in Si nanowires

20. Low energy cluster deposition of nanoalloys

21. Fast three dimensional migration of He clusters in bcc Fe and Fe–Cr alloys

22. Structural modification of a multiply twinned nanoparticle by ion irradiation: A molecular dynamics study

23. Damage production in GaAs and GaAsN induced by light and heavy ions

24. Analytical interatomic potential for modeling nonequilibrium processes in the W–C–H system

25. Measurement of Si 311 defect properties using x-ray scattering

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