1. Characteristic properties of Raman scattering and photoluminescence on ZnO crystals doped through phosphorous-ion implantation.
- Author
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T. S. Jeong, J. H. Yu, H. S. Mo, T. S. Kim, K. Y. Lim, C. J. Youn, and K. J. Hong
- Subjects
ION implantation ,PHOTOLUMINESCENCE measurement ,ZINC oxide synthesis ,PHONONS ,ACOUSTIC vibrations - Abstract
P-doped ZnO was fabricated by means of the ion-implantation method. At the Raman measurement, the blue shift of the E
2 high mode and A1 (LO) phonon of the inactive mode were observed after the P-ion implantation. It suggested to be caused by the compressive stress. Thus, Hall effect measurement indicates that the acceptor levels exists in P-doped ZnO while still maintaining n-type ZnO. From the X-ray photoelectron spectroscopy, the chemical bond formation of the P2p3/2 spectrum consisted of 2(P2 O5 ) molecules. Therefore, the implanted P ions were substituted to the Zn site in ZnO. From the photoluminescence (PL) spectra, P-related PL peaks were observed in the energy ranges of 3.1 and 3.5 eV, and its origin was analyzed at PZn -2VZn complexes, acting as a shallow acceptor. With increasing temperatures, the neutral-acceptor bound-exciton emission, (A0 , X), shows a tendency to quench the intensity and extend the emission linewidth. From the relations of the intensity and the linewidth as a function of temperature, the broadening of linewidth was believed to the result that the vibration mode of E2 high participates in the broadening process of (A0 , X) and the change of luminescent intensity was attributed to the partial dissociation of (A0 , X). Consequently, these facts indicate that the acceptor levels existed in P-doped ZnO layer by the ion implantation. [ABSTRACT FROM AUTHOR]- Published
- 2014
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