1. Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe.
- Author
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Takeuchi, Osamu, Miyakoshi, Takaaki, Taninaka, Atsushi, Tanaka, Katsunori, Cho, Daichi, Fujita, Machiko, Yasuda, Satoshi, Jarvis, Suzanne P., and Shigekawa, Hidemi
- Subjects
ATOMIC force microscopy ,SCANNING probe microscopy ,SPECTRUM analysis ,PROPERTIES of matter ,MICROSCOPY - Abstract
The accuracy of dynamic-force spectroscopy (DFS), a promising technique of analyzing the energy landscape of noncovalent molecular bonds, was reconsidered in order to justify the use of an atomic-force microscopy (AFM) cantilever as a DFS force probe. The advantages and disadvantages caused, for example, by the force-probe hardness were clarified, revealing the pivotal role of the molecular linkage between the force probe and the molecular bonds. It was shown that the feedback control of the loading rate of tensile force enables us a precise DFS measurement using an AFM cantilever as the force probe. [ABSTRACT FROM AUTHOR]
- Published
- 2006
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