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A continuum model is presented which accounts for the spatial variation in properties and the long range electrostatic interactions in functionally graded ferroelectric thin films with an emphasis on the dielectric behavior. It is found that the parallel electrode configuration results in a strong temperature dependence of the dielectric constant due to the strong electrostatic interactions between the different layers.

Wire desorbed radicals present during hot wire chemical vapor deposition growth are measured by quadrupole mass spectrometry. Calculation of the relative rates for the various wire kinetic processes, coupled with experimental observations, reveals that silicon diffusion through the silicide is the slowest process, followed by Si evaporation, with SiH(sub 4) decomposition being the fastest.

We prepared highly aligned, biaxially textured BaxPb1-xTiO3 (PBT) on amorphous Si3N4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric. [ABSTRACT FROM AUTHOR]

We prepared highly aligned, biaxially textured BaxPb1-xTiO3 (PBT) on amorphous Si3N4 by using an ion-beam-assisted deposited MgO as a template layer. PBT was deposited on a biaxially textured MgO using sol-gel synthesis, metal-organic chemical-vapor deposition, and molecular beam epitaxy. The biaxial texture of the PBT was inherited from the MgO template. The reflection high-energy electron diffraction (RHEED) and cross-section transmission electron microscopy (TEM) experiments suggest that exposure of the MgO template to atmospheric moisture before PBT heteroepitaxy resulted in a significant narrowing of the PBT in-plane orientation distribution. The microstructures of the biaxially textured PBT films were analyzed by x-ray diffraction, RHEED, and TEM. The dynamic contact mode electrostatic force microscopy polarization hysteresis loops confirmed that these films are ferroelectric. [ABSTRACT FROM AUTHOR]