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Experimental optical measurements reveal a double-handed circular Bragg response such as at one frequency band a polygonal helix reflects left-handed circularly polarized light, and at a second frequency band reflects right-handed circularly polarized light. The relative wavelength dependence of each reflection band is determined by the physical structure of the polygonal helix.

The one-dimensional electromigration boundary value problem under pulsed dc conditions is numerically examined by applying the transmission-line matrix modeling technique. A technique is suggested for easily transforming the pulsed stress into an equivalent dc stress that would cause electromigration damage at a similar rate. Using the fundamental diffusion-drift model, the vacancy buildup behavior under a pulsed dc stress can be described accurately by the dc stress scaled according to the duty factor of the current pulse.

Transmission-line-matrix (TLM) method evaluates the grain boundary and interfacial diffusion problems in thin films, which is solved as a function of position and time. TLM treats complex structures, incorporates different boundary conditions, has an automatic time-stepping ability and uses a variable mesh. TLM is used in practical applications related to diffusion processes in thin films.

Anisotropic properties of columnar nanoporous thin films were utilized to design and fabricate interference mirrors with lossless omnidirectional reflection in the visible spectral range. Index graded columnar films with distributed Bragg reflector (DBR), sinusoidal, and Gaussian refractive index profiles were studied using finite-difference frequency-domain and finite-difference time-domain methods, with an emphasis on maximizing the omnidirectional reflection bandwidth. Titanium dioxide columnar films with sixteen period sinusoidal refractive index profile were fabricated using the glancing angle deposition technique and characterized by angle resolved transmittance measurements. Simulations and experimental measurements have shown the presence of the omnidirectional reflection band up to 5% wide for a film with a maximum refractive index nmax=2.3 and refractive index contrast Δn=0.8. Simulations further showed that with the optimal choice of the refractive index variation range, the omnidirectional reflection band can reach 10.5% width in TiO2 films with a sinusoidal index profile, 14.5% with a DBR index profile, and 12% with a Gaussian profile. Due to the optical anisotropy of the columnar films, the reflection bandwidth exceeded the corresponding value, observed in isotropic analogs, by a factor of three to four depending on the choice of the refractive index profile. [ABSTRACT FROM AUTHOR]

Nanoimprint lithography was combined with glancing angle deposition (GLAD) of titanium dioxide to fabricate a square spiral columnar film with a bandgap in the visible spectral range. Nanoimprint stamps were fabricated with seed spacing ranging from 80 to 400 nm, and four periods of square spiral film were deposited on top of the 320 nm array of seeds. The ratio of lattice spacing, vertical pitch and spiral arm swing was chosen as a : P : A = 1 : 1.35 : 0.7 and the deposition angle was fixed at 86° to maximize the square spiral film's bandgap. Reflectivity measurements show that the fabricated structure exhibit a pseudo-gap centered at around 600 nm wavelength, in good agreement with finite difference electromagnetic simulations. The absence of a full 3D bandgap is due the deviation of GLAD columns' cross-section from the optimal one, which has to be highly elongated in the deposition plane. However, simulations show that a geometry close to the fabricated one will produce a full 3D bandgap, if the structure is inverted. The material refractive index in such an inverted photonic crystal can be as low as n = 2.15. [ABSTRACT FROM AUTHOR]

Columnar thin films exhibiting linear polarization selectivity have been theoretically investigated and fabricated using the glancing angle deposition (GLAD) technique. The film structure employed an s-shaped columnar morphology that may be either smoothly bent or composed of discrete segments. Finite-difference time-domain and frequency-domain methods have been used to model these thin film structures numerically. Simulation results have yielded optimal geometries in which the films exhibit either a single frequency band with polarization-selective transmittance or two separated frequency bands each transmitting one of two orthogonal linearly polarized modes. Based on these designs, a series of TiO2 films were grown by GLAD with continuous and discrete s-shaped columnar morphology. Experimental measurements by spectrophotometry verified the presence of selectivity for the orthogonal linearly polarized modes. Films with more then 24 periods were found to have polarization selectivity approaching unity. The agreement between the simulation and experimental results demonstrates the potential for future theoretical development of highly selective polarization filters based on GLAD thin films. [ABSTRACT FROM AUTHOR]

Postdeposition thermal annealing is used to enhance the form birefringence of nanostructured TiO2 thin films grown by electron-beam evaporation using the serial bideposition technique. Thin films were grown on fused silica substrates using oblique deposition angles between 60° and 75° and repetitive 180° substrate rotations to produce birefringent thin films that are structurally anisotropic. Postdeposition annealing in air, between 200 and 900 °C, was used to increase the form birefringence of the films by changing the TiO2 phase from the as-deposited amorphous state to a polycrystalline state that exhibits a greater inherent density and larger bulk refractive index. The optical properties, microstructure, and crystallinity were characterized by Mueller matrix ellipsometry, scanning electron microscopy, atomic force microscopy, and x-ray diffraction. It was found that the in-plane birefringence increased significantly upon thermal annealing, in some cases yielding birefringence values that doubled in magnitude, from 0.11 to 0.22 at a wavelength of 550 nm for films annealed at 400 °C. [ABSTRACT FROM AUTHOR]

Thin films with sinusoidally varying refractive index profiles display photonic band gap effects. Intentional deviations from the periodic index profile can be used to tailor the optical properties of the resulting thin film. We present experimental characterization of TiO2 films with periodic index profiles fabricated using a deposition technique known as glancing angle deposition (GLAD). The resulting porous thin films have a microstructure consisting of vertically aligned columns. Sinusoidal porosity gradients, and therefore sinusoidal index profiles, can be introduced in the direction of the substrate normal by fabricating columns with a periodically varying diameter. Local modifications of the index profile are achieved by inserting thin layers of constant porosity into the center of the film, or by discontinuously changing the phase of the sinusoidal gradient. The introduction of these structural defects creates a narrow optical passband inside the larger band gap, and we demonstrate how the properties of this passband can be controlled through modification of the defect parameters. The magnitude of the phase shift constituting the defect is shown to control the location of the resulting passband. By inserting a layer with in-plane birefringence, we show that it is possible to create two separate passbands, one for each polarization, within a single stop band. The results illustrate how nanoscale porosity engineering using GLAD is a precise technique for fabricating one-dimensionally periodic films with a variety of optical characteristics. [ABSTRACT FROM AUTHOR]

Postdeposition thermal annealing is used for enhancing the form birefringence of nanostructured Ti[O.sub.2] thin films grown by electron-beam evaporation by using the serial bideposition method. Annealing temperatures greater than 700 [degree]C have caused an increase in diffuse scattering and absorption and hence 400 to 600 [degree] C is shown to be the ideal range of annealing temperatures that can maximize birefringence without reducing film transparency.

Glancing angle deposition is used to create porous liquid crystal alignment layers with high aspect-ratio, three-dimensional features. We use solid-state deuterium nuclear magnetic resonance to determine the alignment of alpha deuterated 4′-pentyl-4-cyanobiphenyl in a 3.2 μm thick SiO2 film comprised of independent, helical structures. Comparing measured spectra with models, we determine that the liquid crystalline molecules exhibit chiral ordering dictated by the features of the template films. In the plane of deposition the liquid crystalline molecules tilt away from the substrate normal at an average angle of 51°, which is commensurate with the helical features of the chiral template. [ABSTRACT FROM AUTHOR]