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Recently, surface and thin‐film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X‐ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film. Lamellar thin films are an important class of soft materials. For such systems, grazing‐incidence scattering with an area detector close to the incident plane is simulated. [ABSTRACT FROM AUTHOR]

Errors in the article by Smilgies [J. Appl. Cryst. (2019), 52, 247–251] are corrected. [ABSTRACT FROM AUTHOR]

Grazing-incidence small-angle X-ray scattering (GISAXS) patterns of a silver behenate composite film, which has a typical layered structure, are described. The peak position of the film in the GISAXS pattern was varied depending on the incident angle, which was well described by taking into account the refraction and the reflection effects. Since the refractive index of samples depends on sample preparation, it is recommended that the measurement of silver behenate as a standard be done in conventional transmission mode to avoid any complexity. [ABSTRACT FROM AUTHOR]