1. X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study
- Author
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Theodor Secanell Holstad, Trygve Magnus Ræder, Mads Carlsen, Erik Bergbäck Knudsen, Leora Dresselhaus-Marais, Kristoffer Haldrup, Hugh Simons, Martin Meedom Nielsen, and Henning Friis Poulsen
- Subjects
Physics::Optics ,General Biochemistry, Genetics and Molecular Biology - Abstract
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump–probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
- Published
- 2022
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