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Serial electron crystallography has been developed as a fully automated method to collect diffraction data on polycrystalline materials using a transmission electron microscope. This enables useful data to be collected on materials that are sensitive to the electron beam and thus difficult to measure using the conventional methods that require long exposure of the same crystal. The data collection strategy combines goniometer translation with electron beam shift, which allows the entire sample stage to be probed. At each position of the goniometer, the locations of the crystals are identified using image recognition techniques. Diffraction data are then collected on each crystal using a quasi‐parallel focused beam with a predefined size (usually 300–500 nm). It is shown that with a fast and sensitive Timepix hybrid pixel area detector it is possible to collect diffraction data of up to 3500 crystals per hour. These data can be indexed using a brute‐force forward‐projection algorithm. Results from several test samples show that 100–200 frames are enough for structure determination using direct methods or dual‐space methods. The large number of crystals examined enables quantitative phase analysis and automatic screening of materials for known and unknown phases. [ABSTRACT FROM AUTHOR]

Electron diffraction tomography (EDT) has emerged as a successful tool for ab initio atomic structure determination of nanometre‐sized crystals. However, lattice parameters obtained from EDT data are often of lower accuracy than those from powder X‐ray data, owing to experimental errors and data‐processing methods. This work describes a lattice‐parameter refinement method for EDT data using two‐dimensional diffraction vectors and shows that the accuracy of lattice‐parameter determination can be improved significantly. It is also shown that the method is tolerant to sample displacement during data collection and to geometric distortions in the electron diffraction patterns due to lens imperfections. For the data sets tested, the method reduces the 95% confidence interval of the worst errors in angles from ±1.98 to ±0.82° and the worst relative errors of the unit‐cell lengths from ±1.8% to ±1.3%, compared with the conventional method using clustering of three‐dimensional diffraction vectors. The improvement is attributed to the fact that the new method makes use of the positions of two‐dimensional diffraction spots, which can be determined with high accuracy, and disregards the position of the central beam, the orientation of the rotation axis and the angles of the diffraction frames, whose errors all contribute to the errors for lattice‐parameter determination using the three‐dimensional method. [ABSTRACT FROM AUTHOR]

The continuous rotation electron diffraction (cRED) method has the capability of providing fast three‐dimensional electron diffraction data collection on existing and future transmission electron microscopes; unknown structures could be potentially solved and refined using cRED data collected from nano‐ and submicrometre‐sized crystals. However, structure refinements of cRED data using SHELXL often lead to relatively high R1 values when compared with those refined against single‐crystal X‐ray diffraction data. It is therefore necessary to analyse the quality of the structural models refined against cRED data. In this work, multiple cRED data sets collected from different crystals of an oxofluoride (FeSeO3F) and a zeolite (ZSM‐5) with known structures are used to assess the data consistency and quality and, more importantly, the accuracy of the structural models refined against these data sets. An evaluation of the precision and consistency of the cRED data by examination of the statistics obtained from the data processing software DIALS is presented. It is shown that, despite the high R1 values caused by dynamical scattering and other factors, the refined atomic positions obtained from the cRED data collected for different crystals are consistent with those of the reference models refined against single‐crystal X‐ray diffraction data. The results serve as a reference for the quality of the cRED data and the achievable accuracy of the structural parameters. [ABSTRACT FROM AUTHOR]

Serial electron crystallography is being developed as an alternative way to collect diffraction data on beam-sensitive polycrystalline materials. Merging serial diffraction data from a large number of snapshots is difficult, and the dynamical nature of electron diffraction prevents the use of existing methods that rely on precise measurement of kinematical reflection intensities. To overcome this problem, an alternative method that uses rank aggregation to combine the rankings of relative reflection intensities from a large number of snapshots has been developed. The method does not attempt to accurately model the diffraction intensity, but instead optimizes the most likely ranking of reflections. As a consequence, the problem of scaling individual snapshots is avoided entirely, and requirements for the data quality and precision are low. The method works best when reflections can be fully measured, but the benefit over measuring partial intensities is small. Since there were no experimental data available for testing rank-based merging, the validity of the approach was assessed through a series of simulated serial electron diffraction datasets with different numbers of frames and varying degrees of errors. Several programs have been used to show that these rank-merged simulated data are good enough for ab initio structure determination using several direct methods programs. [ABSTRACT FROM AUTHOR]

The structure of a complicated pseudo-decagonal (PD) quasicrystal approximant in the Al-Co-Ni alloy system, denoted as PD1, was solved by the strong-reflections approach on three-dimensional rotation electron diffraction (RED) data, using the phases from the known PD2 structure. RED shows that the PD1 crystal is primitive and orthorhombic, with a = 37.3, b = 38.8, c = 8.2 Å. However, as with other approximants in the PD series, the superstructure reflections (corresponding to c = 8.2 Å) are much weaker than those of the main reflections (corresponding to c = 4.1 Å), so it was decided to solve the PD1 structure in the smaller primitive unit cell first, i.e. with unit-cell parameters a = 37.3, b = 38.8, c = 4.1 Å and space group Pnam. A density map of PD1 was calculated from only the 15 strongest unique reflections. It contained all 31 Co/Ni atoms and many weaker peaks corresponding to Al atoms. The structure obtained from the strong-reflections approach was confirmed by applying direct methods to the complete RED data set. Successive refinement using the RED data set resulted in 108 unique atoms (31 Co/Ni and 77 Al). This is one of the most complicated approximant structures ever solved by electron diffraction. As with other approximants in the PD series, PD1 is built of characteristic 2 nm wheel clusters with fivefold rotational symmetry, which agrees with results from high-resolution electron microscopy images. The simulated electron diffraction patterns for the structure model are in good agreement with the experimental electron diffraction patterns obtained by RED. [ABSTRACT FROM AUTHOR]

Implementation of a computer program package for automated collection and processing of rotation electron diffraction (RED) data is described. The software package contains two computer programs: RED data collection and RED data processing. The RED data collection program controls the transmission electron microscope and the camera. Electron beam tilts at a fine step (0.05-0.20°) are combined with goniometer tilts at a coarse step (2.0-3.0°) around a common tilt axis, which allows a fine relative tilt to be achieved between the electron beam and the crystal in a large tilt range. An electron diffraction (ED) frame is collected at each combination of beam tilt and goniometer tilt. The RED data processing program processes three-dimensional ED data generated by the RED data collection program or by other approaches. It includes shift correction of the ED frames, peak hunting for diffraction spots in individual ED frames and identification of these diffraction spots as reflections in three dimensions. Unit-cell parameters are determined from the positions of reflections in three-dimensional reciprocal space. All reflections are indexed, and finally a list with hkl indices and intensities is output. The data processing program also includes a visualizer to view and analyse three-dimensional reciprocal lattices reconstructed from the ED frames. Details of the implementation are described. Data collection and data processing with the software RED are demonstrated using a calcined zeolite sample, silicalite-1. The structure of the calcined silicalite-1, with 72 unique atoms, could be solved from the RED data by routine direct methods. [ABSTRACT FROM AUTHOR]