1. Microstructural characterization and strengthening mechanism of AlN/Y nanocomposite and nanomultilayered films.
- Author
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Li, Wei, Zhang, Ke, Liu, Ping, Zheng, Wei, Ma, Fengcang, Chen, Xiaohong, Feng, Rui, and Liaw, Peter K.
- Subjects
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NANOCOMPOSITE materials , *MAGNETRON sputtering , *CRYSTALLIZATION , *MECHANICAL properties of metals , *VAPOR-plating - Abstract
The AlN/Y nanocomposite and nanomultilayered films with different Y contents were fabricated by the magnetron sputtering technique. The microstructures and mechanical properties of the AlN/Y nanocomposite and nanomultilayered films were characterized and measured, respectively. The AlN/Y nanocomposite film is composed of equiaxed AlN nanocrystallites encapsulated by the Y interfaces. When the Y:Al ratio is 2:23, Y interfaces can exist as the crystallized state and keep the epitaxial growth with the adjacent AlN nanocrystallites. Accordingly, the crystallization degree and mechanical properties are improved. The AlN/Y nanomultilayered film consists of the evident multilayered structure with distinct interfaces. When the Y-layer thickness is no more than 0.7 nm, Y layers are inclined to grow epitaxially with the adjacent AlN layers, leading to the improvement of crystallization degrees and mechanical properties. The interfacial evolutions and mechanical properties variations between AlN/Y nanocomposite and nanomultilayered films have the common feature as the Y content grows. It has been experimentally and theoretically verified that the AlN/Y nanocomposite and nanomultilayered films have the same coherent-interface strengthening mechanism. [ABSTRACT FROM AUTHOR]
- Published
- 2018
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