20 results on '"Hirayama, Makoto"'
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2. Highly Reliable SiO2 Films Formed by UV-O2 Oxidation
3. Refractive Index Distribution in Photoresist Thin Film Formed by the Spin Coating Method
4. High-Quality CVD/Thermal Stacked Gate Oxide Films with Hydrogen-Free CVD SiO2 Formed in a SiCl4–N2O System
5. Electron Beam Direct Writing Techniques for the Development of Sub-Quarter-Micron Devices
6. Kinetic Study of Silicon Nitride Growth from Dichlorosilane and Ammonia
7. Optical Absorption in Silicon Oxide Film Near the SiO2/Si Interface
8. Fabrication of Storage Capacitance-Enhanced Capacitors with a Rough Electrode
9. Optical Absorption in Ultrathin Silicon Oxide Film
10. The Effect of Gate Bias on Hot Electron Trapping
11. Cross-Over Interconnections in P-MOS Integrated Circuits Using Two-Photomask Process
12. Hetero-Epitaxial Growth of Boron Monophosphide on Silicon Substrate Using B2H6-PH3-H2System
13. 47-Stage P-MOS Ring Oscillator Circuit Using the Two-Photomask Fabrication Process
14. Effect of Long Term Stress on Hot Electron Trapping
15. Hetero-Epitaxial Growth of Lower Boron Arsenide on Si Substrate Using AsH3-B2H6-H2System
16. Time Dependent Dielectric Breakdown of Thin SiO2 Films
17. Hetero-Epitaxial Growth of Lower Boron Phosphide on Silicon Substrate Using PH3-B2H6-H2System
18. Adhesion Improvement of Photoresist on TiN/Al Multilayer by Ozone Treatment
19. High-Quality CVD/Thermal Stacked Gate Oxide Films with Hydrogen-Free CVD SiO2Formed in a SiCl4-N2OSystem
20. Highly Reliable SiO2Films Formed by UV-O2Oxidation
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