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Your search keyword '"Chang, Edward"' showing total 115 results

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5. Field cycling behavior and breakdown mechanism of ferroelectric Al0.78Sc0.22N films.

7. Cerium oxide capping on Y-doped HfO2 films for ferroelectric phase stabilization with endurance improvement.

8. On the thickness scaling of ferroelectricity in Al0.78Sc0.22N films.

10. Reactive sputtering of ferroelectric AlScN films with H2gas flow for endurance improvement

14. Improved linearity and reliability in GaN metal–oxide–semiconductor high-electron-mobility transistors using nanolaminate La2O3/SiO2 gate dielectric

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