Author: "Jaume Segura" / Journal: itc - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Jaume Segura"' showing total 6 results

Start Over Author "Jaume Segura" Journal itc

6 results on '"Jaume Segura"'

1. Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.

Author: Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura 0001, and Ali Keshavarzi
Published: 2004
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2. CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing.

Author: Bartomeu Alorda, Brad Bloechel, Ali Keshavarzi, and Jaume Segura 0001
Published: 2003
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3. Parametric Failures in CMOS ICs - A Defect-Based Analysis.

Author: Jaume Segura 0001, Ali Keshavarzi, Jerry M. Soden, and Charles F. Hawkins
Published: 2002
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4. Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.

Author: Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, and Jaume Segura 0001
Published: 2002
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5. A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.

Author: Jaume Segura 0001, Carol de Benito, Antonio Rubio 0001, and Charles F. Hawkins
Published: 1995
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6. GHz Testing and Its Fuzzy Targets.

Author: Chuck Hawkins and Jaume Segura 0001
Published: 2002

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