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In this paper, the characteristics of layered structures (photonic or electromagnetic bandgaps), including chiral media, are studied by means of two different numerical methods, one in the time domain (finite differences in the time domain, FDTD) and the other in the frequency domain (coupled-mode method, CMM). The results (reflection and transmission coefficients for a plane wave normally incident over a layered structure) obtained by means of both well different techniques are practically identical. Copyright © 2009 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

A transmission line matrix (TLM) model suitable to simulate the propagation of waves in moving anisotropic continuous media is presented. As is well known, an electromagnetic wave propagating in a general medium, moving with respect to its source, experiences a drag by the own medium, which involves a wave velocity dependent on the direction of propagation. In this work, we present a first approach for the case of uniform movement of an anisotropic dielectric medium with respect to an electromagnetic source. Although the technique allows for quantitative results, special attention is devoted to the simulation of wave fronts, distorted elliptical fronts, because a particular kind of ‘anisotropy’ appears, even in an isotropic medium. Copyright © 2005 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

The TLM method, being a time domain method, cannot deal directly with frequency dispersive media. A way for modelling such media, for instance, dielectric dispersive ones, is proposed, starting from the causality relationship between field vectors D and E, which is discretized over the same space–time mesh as the three-dimensional TLM mesh (in our case, with HSCN node). This leads to adding, at each node on the network, three voltage sources (one for each field component), their value depending on the previous instants. The method is validated by computing the reflection (magnitude and phase) coefficient at normal incidence at an air–dielectric interface, for different dispersive behaviours of the dielectrics. Copyright © 2001 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]