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A novel method for fault diagnosis of analog circuits with tolerance based on wavelet packet (WP) decomposition and probabilistic neural networks using genetic algorithm (GPNN) is proposed in this paper. The fault feature vectors are extracted after feasible domains on the basis of WP decomposition of responses of a circuit being solved. Then by fusing various uncertain factors into probabilistic operations, GPNN methods to diagnose faults are proposed whose parameters and structure obtained form genetic optimisations resulting in best detection of faults. Finally, simulations indicated that GPNN classifiers are correct 7% more than BPNN of the test data associated with our sample circuits. [ABSTRACT FROM AUTHOR]