1. All-Nb thin film microbridge-type Josephson junction for submillimeter-wave detection
- Author
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Nobumitsu Hirose, Mitsuo Kawamura, Matsuo Sekine, Shigeru Yoshimori, and Yuichi Harada
- Subjects
Josephson effect ,Materials science ,business.industry ,General Engineering ,Niobium ,chemistry.chemical_element ,Methacrylate ,chemistry ,Resist ,Etching (microfabrication) ,Cathode ray ,Optoelectronics ,Reactive-ion etching ,Thin film ,business - Abstract
A copolymer of methyl methacrylate (MMA) and 3-triethoxysilylpropyl methacrylate (ESPMA) was proposed as a positive-working electron beam (EB) resist of a new type. It was found that it had 4–10 times the resistance of polymethylmethacrylate (PMMA) against CBrF3 plasma damage. The mechanism of etching Nb in reactive-ion-etching (RIE) was deciphered. Using the new EB resist and nanometer process technology, an all-Nb thin film microbridge was fabricated. It shows the a.c. Josephson effect, i.e. the Shapiro steps upto the 11th were observed under millimeter-wave (70 GHz) radiation. In addition the coherently working performance of the series array of these thin-film microbridges were observed definitively.
- Published
- 1993
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