1. Flexible and convertible depth exposure in fluorescence microscopy
- Author
-
Koichiro Kishima
- Subjects
Fluorescence-lifetime imaging microscopy ,Optics ,Materials science ,Two-photon excitation microscopy ,Super-resolution microscopy ,business.industry ,Light sheet fluorescence microscopy ,Microscopy ,Chromatic aberration ,Scanning confocal electron microscopy ,Photoactivated localization microscopy ,business - Abstract
We proposed and demonstrated the effective method to measure the three dimensional position of fluorescent marker with using conventional fluorescence microscope. In this method the position information in focusing direction is recorded into blurring information. We confirmed this method has enough precision by using engineering specimen and also we have succeeded to measure chromatic aberration of imaging system.
- Published
- 2010
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