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Your search keyword '"Fadl, Sondos M."' showing total 1 results

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Start Over You searched for: Author "Fadl, Sondos M." Remove constraint Author: "Fadl, Sondos M." Topic image forensics Remove constraint Topic: image forensics Publication Year Range Last 50 years Remove constraint Publication Year Range: Last 50 years Journal iet image processing (wiley-blackwell) Remove constraint Journal: iet image processing (wiley-blackwell)
1 results on '"Fadl, Sondos M."'

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1. Inter‐frame forgery detection based on differential energy of residue.

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