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Start Over Author "Place S" Journal ieee transactions on nuclear science
4 results on '"Place S"'

4. Radiation Effects on CMOS Image Sensors With Sub-2 \mum Pinned Photodiodes.

Author

Place, S., Carrere, J.-P., Allegret, S., Magnan, P., Goiffon, V., and Roy, F.

Subjects
*METAL semiconductor field-effect transistors, *MONTE Carlo method, *COMPLEMENTARY metal oxide semiconductors, *DIGITAL cameras, *IRRADIATION, *DETECTORS
Abstract

CMOS image sensor hardness under irradiation is a key parameter for application fields such as space or medical. In this paper, four commercial sensors featuring different technological characteristics (pitch, isolation or buried oxide) have been irradiated with ^60Co source. Based on dark current and temporal noise analysis, we develop and propose a phenomenological model to explain pixel performance degradation. [ABSTRACT FROM AUTHOR]

Published
2012
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