1. High-resolution X-ray imaging using a silicon strip detector
- Author
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Beuville, E., Cahn, R., Cederstrom, B., Danielsson, M., Hall, A., Hasegawa, B., Luo, L., Lundqvist, M., Nygren, D., Oltman, E., and Walton, J.
- Subjects
Imaging systems -- Research ,X-rays -- Research ,Business ,Electronics ,Electronics and electrical industries - Abstract
We are presenting the first images and an initial evaluation of a scanned-slot X-ray imaging system based on edge-on silicon strip detectors and high-speed low-noise parallel processing ASICs. We have demonstrated noiseless single photon counting above a minimal threshold of 7.2 keV. Edge scans show negligible cross talk between different channels in the ASIC. The Modulation Transfer Function (MTF) has been measured and found to agree with the ideal MTF for 100 [[micro]meter] pixel size. The first images are obtained at very low exposures and show the high performance of the system. We also present a way of enhancing the X-ray flux to a slot by using a refractive X-ray lens. We believe this focusing device will significantly enhance the potential for scanned-slot X-ray imaging.
- Published
- 1998