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In 2016, we published a method for processing dual-energy computed tomography (DECT) data called system-independent rho-e/Z-e ( $\rho _{\mathrm {e}}/Z_{\mathrm {e}}$ ) or SIRZ. Using data from multiple DECT systems and spectra, SIRZ estimated the electron density $\rho _{\mathrm {e}}$ and effective atomic number $Z_{\mathrm {e}}$ (based on published X-ray cross sections), for a set of known specimens. However, the decomposition process required complex spectral modeling of the DECT system, which made SIRZ difficult to implement and automate. This paper describes the subsequent work on “SIRZ-2” to simplify the spectral modeling, automate the process, and improve its range and versatility. The SIRZ-2 basis functions are more accurate for the X-ray energy range ( $Z_{\mathrm {e}}$ of 6–20) were scanned with multiple spectral pairs (up to 200 keV) on seven different DECT systems, including a commercial airport luggage scanner. For these varied tests, the average SIRZ-2 relative errors for $\rho _{\mathrm {e}}$ estimates were four times lower (0.7% compared to 3.0% for SIRZ), while average $Z_{\mathrm {e}}$ relative errors were comparably low for both methods ( $\rho _{\mathrm {e}}$ , $Z_{\mathrm {e}}$ ) that can be directly compared across DECT systems and over time.

In this paper, based on an invited talk at SORMA (May 2016), we present an overview of x-ray sources, detectors and system configurations for non-intrusive inspection (NII) of cargo containers. Our emphasis is on dual-energy x-ray NII for detecting high-atomic-number ( $\text {Z}\geq 72$ ) materials such as tungsten shielding and special nuclear materials (SNM). Standard single-energy (MeV and above) x-rays needed to penetrate and image cargo provide little SNM contrast, whereas dual-energy x-ray NII is demonstrated as a way to improve the selectivity of materials with Z $\text {Z}\geq 72$ . For two possible dual-energy x-ray source technologies—polyenergetic dual-energy (PDE) and quasi-monoenergetic x-ray sources (QMXS)—we investigate their trade-offs and future prospects using experimental and simulated results. The reduced scatter and larger separation of low- and high-energy photons provided by QMXS offers improved high-Z material contrast, but practical considerations such as flux and pulse rate need to be solved before making a deployable system. Straight-ray simulations show factor of four increases in contrast for QMXS over PDE scans of tin (Z=50) and iron (Z=26) relative to a uranium plate (Z=92) behind 20 cm of iron simulated cargo.

We present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feature space consists of electron density, ${\rho _{\rm e}}$ , and a new effective atomic number, ${{\rm Z}_{\rm e}}$ , which is based on published X-ray cross sections. Reference materials are used in conjunction with the system spectral response so that additional beam-hardening correction is not necessary. The technique is tested against other methods on DECT data of known specimens scanned by diverse spectra and systems. Uncertainties in accuracy and precision are less than 3% and 2% respectively for the ( ${\rho _{\rm e}}$ , ${{\rm Z}_{\rm e}}$ ) results compared to prior methods that are inaccurate and imprecise (over 9%).

An efficient method for accurately calculating the center-of-rotation, or projection center, for parallel computed tomography projection data, or sinograms, is described. This method uses all the data in the sinogram to estimate the center by a least-squares technique and requires no previous calibration scan. The method also finds the object's center-of-mass without reconstructing its image. Since the method uses the measured data, it is sensitive to noise in the measurements, but that sensitivity is relatively small compared to other techniques. Examples of its use on simulated and actual data are included. For fan-beam data over 360 degrees , two related methods are described to find the center in the presence or absence of a midline offset. >