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Start Over Author "Gouker, Pascale M." Journal ieee transactions on nuclear science
6 results on '"Gouker, Pascale M."'

2. Hardness Assurance Testing for Proton Direct Ionization Effects

Author

Schwank, James R., primary, Shaneyfelt, Marty R., additional, Ferlet-Cavrois, Véronique, additional, Dodd, Paul E., additional, Blackmore, Ewart W., additional, Pellish, Jonathan A., additional, Rodbell, Kenneth P., additional, Heidel, David F., additional, Marshall, Paul W., additional, LaBel, Kenneth A., additional, Gouker, Pascale M., additional, Tam, Nelson, additional, Wong, Richard, additional, Wen, Shi-Jie, additional, Reed, Robert A., additional, Dalton, Scott M., additional, and Swanson, Scot E., additional

Published
2012
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3. Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs

Author

Schwank, James R., primary, Shaneyfelt, Marty R., additional, Dodd, Paul E., additional, McMorrow, Dale, additional, Warner, Jeffrey H., additional, Ferlet-Cavrois, Véronique, additional, Gouker, Pascale M., additional, Melinger, Joseph S., additional, Pellish, Jonathan A., additional, Rodbell, Kenneth P., additional, Heidel, David F., additional, Marshall, Paul W., additional, LaBel, Kenneth A., additional, and Swanson, Scot E., additional

Published
2011
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4. Radiation Effects in 3D Integrated SOI SRAM Circuits

Author

Gouker, Pascale M., primary, Tyrrell, Brian, additional, D'Onofrio, Richard, additional, Wyatt, Peter, additional, Soares, Tony, additional, Hu, Weilin, additional, Chen, Chenson, additional, Schwank, James R., additional, Shaneyfelt, Marty R., additional, Blackmore, Ewart W., additional, Delikat, Kelly, additional, Nelson, Marty, additional, McMarr, Patrick, additional, Hughes, Harold, additional, Ahlbin, Jonathan R., additional, Weeden-Wright, Stephanie, additional, and Schrimpf, Ron, additional

Published
2011
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5. SET Characterization in Logic Circuits Fabricated in a 3DIC Technology

Author

Gouker, Pascale M., primary, Tyrrell, Brian, additional, Renzi, Matthew, additional, Chen, Chenson, additional, Wyatt, Peter, additional, Ahlbin, Jonathan R., additional, Weeden-Wright, Stephanie, additional, Atkinson, Nick M., additional, Gaspard, Nelson J., additional, Bhuva, Bharat L., additional, Massengill, Lloyd W., additional, Zhang, Enxia, additional, Schrimpf, R., additional, Weller, Robert A., additional, King, Michael P., additional, and Gadlage, Matthew J., additional

Published
2011
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6. Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

Author

Schwank, James R., primary, Shaneyfelt, Marty R., additional, Dodd, Paul E., additional, McMorrow, Dale, additional, Vizkelethy, Gyorgy, additional, Ferlet-Cavrois, Véronique, additional, Gouker, Pascale M., additional, Flores, Richard S., additional, Stevens, Jeffrey, additional, Buchner, Stephen B., additional, Dalton, Scott M., additional, and Swanson, Scot E., additional

Published
2011
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