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This paper presents a methodology for accurate characterization of Single Event Transient (SET) propagation in SRAM-based Field Programmable Gate Arrays (FPGAs): both generation and measurement of SETs are implemented on chip, respectively connected to input port and output port of the test combinational paths. The scheme we developed is mainly based on two circuits: 1) the one is a SET generating circuit for on-chip producing an adjustable pulse with a temporal resolution of near 100 ps; 2) the other is a SET measuring circuit for on-chip measuring pulses with a temporal resolution of near 80 ps and the ability to detect narrow transient pulses of about 300 ps. Based on above methodology, we investigate the effect of traversing seven logic chains with different gate types and multiple chain lengths on pulse widths, i.e., Propagation Induced Pulse Distorting (PIPD). Results demonstrate, when SETs propagate along Look Up Tables (LUTs) in Virtex-6 FPGAs, there is a broadening for negative SETs (1-0-1) while not for positive SETs (0-1-0); in addition, pulse width has no impact on PIPD, and which is linearly proportional to the number of stages. [ABSTRACT FROM AUTHOR]