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Start Over Author "Zhang, B.L." Journal ieee transactions on electron devices
1 results on '"Zhang, B.L."'

1. Experimental verification of the dependence of bipolar transistor flicker noise on power dissipation

Author

Forbes, L., Zhang, C.W., and Zhang, B.L.

Subjects
Circuit design -- Testing, Bipolar transistors -- Electric properties, Circuit designer, Integrated circuit design, Business, Electronics, Electronics and electrical industries
Abstract

The study demonstrated with the help of experiments and theory that noise in bipolar transistors, with low impedance in the base circuit, has a strong dependence on collector-emitter voltage and power dissipation at frequencies in the kHz range. The noise power spectral density has been shown to depend upon the increase in device temperature above the ambient temperature.

Published
2002

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