1. ReSta: Recovery of Accuracy During Training of Deep Learning Models in a 14-nm Technology-Based ReRAM Array
- Author
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Athena, Fabia Farlin, Gong, Nanbo, Muralidhar, Ramachandran, Solomon, Paul, Vogel, Eric M., Narayanan, Vijay, and Ando, Takashi
- Abstract
In this article, we propose an electrical bias technique to recover the accuracy of a degraded
${\text {HfO}}_{x}$ ${\sim } {10}^{{4}}$ - Published
- 2023
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