11 results on '"Bao, Meng-tian"'
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2. Simulation Study of Single-Event Effects for the 4H-SiC VDMOSFET With Ultralow On-Resistance
3. Impact of Heavy-Ion Irradiation in an 80-V Radiation-Hardened Split-Gate Trench Power UMOSFET
4. Simulation Study on Single-Event Burnout in Rated 1.2-kV 4H-SiC Super-Junction VDMOS
5. Simulation Study of Single-Event Burnout in 1.5-kV 4H-SiC JTE Termination
6. A Snapback Suppressed RC-IGBT With N-Si/n-Ge Heterojunction at Low Temperature
7. Single-Event Burnout Hardening Method and Evaluation in SiC Power MOSFET Devices
8. An Improved V CE–E OFF Tradeoff and Snapback-Free RC-IGBT With P⁺ Pillars
9. Single-Event Burnout Hardness for the 4H-SiC Trench-Gate MOSFETs Based on the Multi-Island Buffer Layer
10. An Improved VCE–EOFF Tradeoff and Snapback-Free RC-IGBT With P⁺ Pillars.
11. A Charge-Plasma-Based Transistor With Induced Graded Channel for Enhanced Analog Performance
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