1. Lightweight Integrated Design of PUF and TRNG Security Primitives Based on eFlash Memory in 55-nm CMOS.
- Author
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Larimian, S., Mahmoodi, M. R., and Strukov, D. B.
- Subjects
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RANDOM number generators , *BIT error rate , *CURRENT fluctuations , *FLASH memory , *INTERNET of things , *ENERGY consumption , *CRYPTOSYSTEMS , *ERROR rates - Abstract
We present a lightweight, suitable for Internet of Things (IoT) devices, integrated design of physically unclonable function (PUF) and true random number generator (TRNG) based on embedded flash memory in 55-nm CMOS. In the proposed approach, the randomness in nonlinear I - V characteristics and temporal current fluctuations of embedded flash memories are exploited to generate the dynamic and static entropies. Shared silicon in designing PUF and TRNG results in a very compact and energy-efficient topology. Experimental and simulation results demonstrate >10200 key space, 0.58-pJ/b energy efficiency for < 5% controllable bit error rate at 80 °C, up to 192.3-Mbps throughput, high Shannon entropy, and resiliency toward machine learning attacks. Accelerated aging measurements indicate stable physical unclonable function response after 900 min of baking at 85 °C. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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