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Your search keyword '"Schrimpf, Ronald D."' showing total 2 results
2 results on '"Schrimpf, Ronald D."'

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1. Hot-Carrier Degradation in GaN HEMTs Due to Substitutional Iron and Its Complexes.

2. Gate Bias Dependence of Defect-Mediated Hot-Carrier Degradation in GaN HEMTs.

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