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In network on chips (NoCs) design, reconfiguration of NoC is a very effective option for minimizing power consumption, and Gaussian networks can provide significant advantage over the mesh networks in terms of network diameter, average hop distance and so on. In this paper, based on the special topology structure and the static connection rules within Gaussian networks, we present the reconfiguration representation for Gaussian networks and the nature of reconfigurable Gaussian networks. Furthermore, reconfigurable rules of Gaussian networks are proposed to design the constraints for automatic reconfiguration of NoC. [ABSTRACT FROM PUBLISHER]

Networks-on-chip (NoCs) have been increasingly adopted in recent years due to the extensive integration of many components in modern multicore processors and system-on-chip designs. At the same time, transistor reliability is becoming a major concern due to the continuous scaling of silicon. As the sole medium of on-chip communication, it is critical for a NoC to be able to tolerate many permanent transistor failures. In this paper, we propose uDIREC, a unified framework for permanent fault diagnosis and subsequent reconfiguration in NoCs, which provides graceful performance degradation with an increasing number of faults. Upon in-field transistor failures, uDIREC leverages a fine-resolution diagnosis mechanism to disable faulty components very sparingly. At its core, uDIREC employs MOUNT, a novel routing algorithm to find reliable and deadlock-free routes that utilize all the still-functional links in the NoC. We implement uDIREC's reconfiguration as a truly-distributed hardware solution, still keeping the area overhead at a minimum. We also propose a software-implemented reconfiguration that provides greater integration with our software-based diagnosis scheme, at the cost of distributed nature of implementation. Regardless of the adopted implementation scheme, uDIREC places no restriction on topology, router architecture and number and location of faults. Experimental results show that uDIREC, implemented in a 64-node NoC, drops 3 $\times$ fewer nodes and provides greater than 25 percent throughput improvement (beyond 15 faults) when compared to other state-of-the-art fault-tolerance solutions. uDIREC's improvement over prior-art grows further with more faults, making it a effective NoC reliability solution for a wide range of fault rates. [ABSTRACT FROM AUTHOR]

We consider a competitive environment for reward-based scheduling of periodic tasks, where the execution of each task consists of a mandatory and an optional part. Each task obtains a value if the processor successfully schedules all its mandatory part, and also an additional reward value if the processor successfully schedules a part of its optional execution. Each task is owned by a self-interested agent who has multiple choices for its requests based on its optional part. We model the reward-based scheduling problem by considering such multi-minded agents. However, the agent may try to manipulate the system to obtain an unfair optional allocation. We address this challenge by designing novel truthful mechanisms in which it is always in the agent's best interest to report their true task characteristics. We propose two truthful mechanisms (an exact and approximate) for selecting a feasible subset of agents and an allocation of optional execution that maximizes the total reward obtained by the selected tasks. To address the pseudo-polynomial complexity of the exact mechanism, we show that our proposed approximate mechanism is a polynomial-time approximation scheme (PTAS). Our extensive experiments show that our proposed approximation mechanism is capable of finding near-optimal solutions efficiently while guaranteeing truthfulness. [ABSTRACT FROM PUBLISHER]

Due to their high density, modern DRAMs are very susceptible to the interactions between adjacent cells, which in turn increases the difficulty and complexity of memory testing. In this work, we studied the interaction mechanisms among neighbouring DRAM cells in order to provide an efficient testing solution. According to the open literature, there are two mechanisms responsible for this interaction: leakage currents and cell state transitions. The frequently used Coupling Fault (CF) model is inadequate to model the combined effect of these mechanisms, while testing procedures using the Neighborhood Pattern Sensitive Fault (NPSF) model are not time efficient solutions. Towards this direction, we propose a new fault model, the Neighborhood Leakage and Transition Fault (NLTF) model for DRAMs, which effectively models the faulty behavior related to neighbouring cell interference. In addition, we developed a new test algorithm which is based on the NLTF model, and provides test application time reductions ranging from 68 to 87 percent with respect to the existing testing algorithms in the literature that are capable to cover the NLTFs. Finally, the proposed algorithm is extended to cover NLTFs in word-oriented DRAMs. [ABSTRACT FROM AUTHOR]

We introduce an algorithm to compare a binary floating-point (FP) number and a decimal FP number, assuming the “binary encoding” of the decimal formats is used, and with a special emphasis on the basic interchange formats specified by the IEEE 754-2008 standard for FP arithmetic. It is a two-step algorithm: a first pass, based on the exponents only, quickly eliminates most cases, then, when the first pass does not suffice, a more accurate second pass is performed. We provide an implementation of several variants of our algorithm, and compare them. [ABSTRACT FROM PUBLISHER]