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Start Over Descriptor "COMPUTER software testing" Search Limiters Full Text Topic debugging Topic integrated circuits testing Topic testing Journal ieee transactions on computer-aided design of integrated circuits & systems
1 results on '"COMPUTER software testing"'

1. A Metric for Test Set Characterization and Customization Toward Fault Diagnosis.

Author

Kundu, Subhadip, Pal, Sankhadeep, Chattopadhyay, Santanu, Sengupta, Indranil, and Kapur, Rohit

Subjects
*DEBUGGING, *INTEGRATED circuits testing, *TESTING, *ELECTRONIC data processing, *COMPUTER software testing
Abstract

This paper introduces a new metric to characterize test sets in terms of their diagnostic power. Our method uses much less space compared to the existing ones and is quite accurate. The metric can be utilized to increase the diagnosability of incompletely specified test sets via don't care filling. The X-filling approach can be integrated with test pattern generation tools to aid in better diagnostic pattern set generation. [ABSTRACT FROM PUBLISHER]

Published
2013
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