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X-ray free-electron lasers (FELs) provide cutting-edge tools for fundamental researches to study nature down to the atomic level at a time-scale that fits this resolution. A precise knowledge of temporal information of FEL pulses is the central issue for its applications. Here we proposed and demonstrated a novel method to determine the FEL temporal profiles online. This robust method, designed for ultrafast FELs, allows researchers to acquire real-time longitudinal profiles of FEL pulses as well as their arrive times with respect to the external optical laser with a resolution better than 6 fs. Based on this method, we can also directly measure various properties of FEL pulses and correlations between them online. This helps us to further understand the FEL lasing processes and realize the generation of stable, nearly fully coherent soft X-ray laser pulses at the Shanghai Soft X-ray FEL facility. This method will enhance the experimental opportunities for ultrafast science in various areas.

X-ray free-electron lasers (FELs) provide cutting-edge tools for fundamental researches to study nature down to the atomic level at a time-scale that fits this resolution. A precise knowledge of temporal information of FEL pulses is the central issue for its applications. Here we proposed and demonstrated a novel method to determine the FEL temporal profiles online. This robust method, designed for ultrafast FELs, allows researchers to acquire real-time longitudinal profiles of FEL pulses as well as their arrive times with respect to the external optical laser with a resolution better than 6 fs. Based on this method, we can also directly measure various properties of FEL pulses and correlations between them online. This helps us to further understand the FEL lasing processes and realize the generation of stable, nearly fully coherent soft X-ray laser pulses at the Shanghai Soft X-ray FEL facility. This method will enhance the experimental opportunities for ultrafast science in various areas., Competing Interests: The authors declare that they have no conflicts of interest in this work., (© 2022 The Authors. Publishing Services by Elsevier B.V. on behalf of KeAi Communications Co. Ltd.)