Descriptor: "testing -- Usage" / Journal: electronic design - Searchworks@Jio Institute Digital Library Search Results

Author: Jerse, Tom and Cramer, Will
Subjects: Standard IC, Testing equipment -- Usage, Integrated circuits -- Testing -- Usage, Semiconductor chips -- Testing -- Usage, Testing -- Usage
Abstract: Mixers are ubiquitous. They are critical components in the realization of a wide range of radio-frequency (RF) and microwave systems. However, to determine a mixer's suitability for a particular application, […]
Published: 1992

Author: Cigoy, Dale
Subjects: Productivity, Performance improvement, Product enhancement, Electronics industry, Testing equipment -- Usage -- Product enhancement, Testing -- Usage, Electronics industry -- Product enhancement, Industrial productivity -- Usage, Electronics -- Product enhancement -- Usage
Abstract: Modern digital multimeters (DMMs) offer more sensitive measurements and more sophisticated features than ever before. The measurement realm of the DMM now includes lower voltages (microvolt to nanovolt), lower currents […]
Published: 1991

Author: Nurie, Ghulam M.
Subjects: Application installation/distribution software, Standard IC, Custom IC, Application development software, Application-specific integrated circuit, Custom integrated circuits -- Testing -- Design and construction -- Usage, Integrated circuits -- Design and construction -- Usage, Testing -- Usage, Semiconductor chips -- Design and construction -- Usage, Program development software -- Usage, Application-specific integrated circuits -- Testing -- Design and construction -- Usage, Hardware description languages -- Usage
Abstract: Low process yields require that complex ASICs have test programs with high fault coverage. Unfortunately, conventional methods of automatic-test-pattern generation attempt to create test vectors by considering only the structural […]
Published: 1991

Author: Wolaver, Dan and Hanley, James
Subjects: Digital communication, Digital signal processor, Data communications -- Testing -- Usage, Digital communications -- Usage, Testing -- Usage, Signal processing -- Usage, Digital signal processors -- Usage
Abstract: A critical element in a digital transmission system is how error-free its transmissions are. This measurement is made by a bit-error-rate tester (BERT), which replaces one or more of the […]
Published: 1991

Author: Novellino, John
Subjects: Microprocessor, Integrated circuit design, Circuit designer, Microprocessor upgrade, Central processing units -- Usage, Circuit design -- Usage, Microprocessors -- Usage, Testing equipment -- Design and construction -- Usage, Testing -- Usage
Abstract: Spectrum analyzers are somewhat esoteric instruments. The frequency domain still holds some mystery for many designers, especially at RF levels. But increasing use of digital technology in spectrum analyzers is […]
Published: 1992

Author: Novellino, John
Subjects: GUI, Tektronix Inc. -- Product introduction, Tektronix TDS 520 (Oscilloscope) -- Product introduction, Tektronix TDS 540 (Oscilloscope) -- Product introduction, Oscilloscopes -- Product introduction -- Usage, Testing -- Usage, Digital storage oscilloscope -- Product introduction -- Usage, Graphical user interface -- Usage -- Product introduction
Abstract: With all of the powerful features and functions added to digital oscilloscopes in recent years, it may be easy to overlook one very important attribute: ease of use. Learning to […]
Published: 1991

Author: Pease, Bob
Subjects: Semiconductor industry, Standard IC, Time to market, Temperature -- Usage, Semiconductor industry -- Product development, Integrated circuits -- Usage -- Product development, Sensors -- Testing -- Usage -- Product development, Product development -- Usage, Testing -- Usage, Semiconductor chips -- Usage -- Product development, Instrument industry -- Product development
Abstract: There are many things I do with cardboard boxes. I stow papers in some of the nice boxes we get our Xerox paper in, and we stow circuits and parts […]
Published: 1991

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