1. Spray Pyrolysis Synthesis of Pure and Mg-Doped Manganese Oxide Thin Films
- Author
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D. Tonneau, Mohamed Amine Dahamni, Abed Bouadi, S. E. Naceri, Carole Fauquet, M. Ghamnia, Jean-Jacques Pireaux, Université d'Oran 1 Ahmed Ben Bella [Oran], Université de Relizane, Laboratoire des Sciences de la Matière Condensée, Laboratoire des Sciences de la Matière Condensée (LSMC), Centre Interdisciplinaire de Nanoscience de Marseille (CINaM), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS), Université de Namur [Namur] (UNamur), UNITÉ DE RECHERCHE INTERDISCIPLINAIRE DE SPECTROSCOPIE ELECTRONIQUE (LISE), Aix Marseille Université (AMU), and Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)
- Subjects
Materials science ,Band gap ,Scanning electron microscope ,Analytical chemistry ,chemistry.chemical_element ,02 engineering and technology ,Manganese ,[CHIM.INOR]Chemical Sciences/Inorganic chemistry ,010402 general chemistry ,01 natural sciences ,nanograins ,X-ray photoelectron spectroscopy ,Materials Chemistry ,XPS ,Thin film ,Spectroscopy ,[PHYS]Physics [physics] ,MnO ,Doping ,technology, industry, and agriculture ,Surfaces and Interfaces ,021001 nanoscience & nanotechnology ,Engineering (General). Civil engineering (General) ,0104 chemical sciences ,Surfaces, Coatings and Films ,Chemical state ,chemistry ,TA1-2040 ,AFM ,0210 nano-technology ,spray pyrolysis - Abstract
Pure and Mg-doped manganese oxide thin films were synthesized on heated glass substrates using the spray pyrolysis technique. The surface chemical composition was investigated by the use of X-ray photoelectron spectroscopy (XPS). Structural and morphological properties were studied by using X-ray diffraction (XRD), scanning electron microscope (SEM) and atomic force microscopy (AFM). Optical properties were characterized by UV-visible spectroscopy. XPS spectra showed typical Mn (2p3/2), (2p1/2) and O (1s) peaks of Mn3O4 with a slight shift attributed to the formation of different chemical states of manganese. XRD analysis revealed the tetragonal phase of Mn3O4 with a preferred (211) growth orientation that improved with Mg-doping, likewise, grain size is observed to increase with the Mg doping. SEM images of Mn3O4 films showed rough surfaces composed of uniformly distributed nanograins whose size decreases with the Mg-doping. The manganese oxide films surface observed in AFM show a textured, rough and porous surface. The combination of transmittance and absorption data in the UV-visible range allowed determining the energy values of the Eg band gap (1.5–2.5 eV). The decrease of the band gap with the Mg-doping increase is attributed to the influence of the greater size of the Mg2+ ion in the manganese oxide lattice.
- Published
- 2021
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