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25 results on '"Bo HE"'

1. Characteristics of 355 nm Laser Damage in Bulk Materials

Author

Zhou Fang, Hong-Bo He, Zhenkun Yu, Dawei Li, and Hongji Qi

Subjects
Optics, Materials science, Laser damage, business.industry, law, Thermal, General Physics and Astronomy, Irradiation, business, Laser, law.invention
Abstract

The laser damage resistances of four crystals (CaF2, MgF2, Al2O3, and SiO2) and fused silica (JGS1) irradiated at 355 nm (8 ns, 300-on-1) are reported. The laser-induced damage threshold is measured using a tripled Nd:YAG laser system. The results obtained from the pure crystals are in accordance with their specific optical, mechanical, and thermal properties. An empirical law based on the Franz—Keldysh effect can interpret the experimental results.

Published
2013
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22. A More Restrictive Upper Bound for the Bare Pomeron Intercept

Author

Bo He, Fei Peng, and Wei Zhu

Subjects
Physics, Pomeron, Particle physics, Proton, High Energy Physics::Lattice, Quantum electrodynamics, High Energy Physics::Phenomenology, Evolution equation, General Physics and Astronomy, High Energy Physics::Experiment, Upper and lower bounds, Gluon
Abstract

By studying the properties of the modified Gribov-Levin-Ryskin evolution equation which incorporates both shadowing and antishadowing effects, the more restrict upper bound is set for the bare pomeron intercept in the case when gluons uniformly distribute within the proton.

Published
1998
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23. Evolution of Residual Stress and Structure in YSZ/SiO2 Multilayers with Different Modulation Ratios.

Author

Qi-Ling, XIAO, Guo-Hang, HU, Hong-Bo, HE, and Jian-Da, SHAO

Subjects
RESIDUAL stresses, ELECTRONIC modulation, GLASS, X-ray diffraction, OPTICAL interferometers
Abstract

The multilayer (ML) YSZ/SiO2 films with different modulation ratios ranging from 1:3, 4:9, 1:1 to 3:1 (the thickness ratio of the YSZ to SiO2) are deposited on BK7 glass substrates by electron beam evaporation under the same processing conditions. The effect of modulation ratio on the residual stresses and structure are investigated by an optical interferometer and Grazing incidence x-ray diffraction. The results show that the total residual stress in MLs is compressive and decreases to tensile when the modulation ratio is changed from 1:3 to 3:1. The YSZ films are of cubic phase structure and the SiO2 films are amorphous in all the MLs. The change of residual stress in these MLs can be attributed to the variation of an individual layer?s stress with thickness, which indicates that adjusting the thickness ratio of two materials is an effective measure for depositing near-zero stress MLs. [ABSTRACT FROM AUTHOR]

Published
2013
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25. Photon Counting Optical Time Domain Reflectometry Applying a Single Photon Modulation Technique.

Author

Xiao, Wang, Jing, Wang, Bo, He, Lian, Xiao, and, Tuan, and Suo, Jia

Subjects
PHOTON detectors, TIME-domain reflectometry, ELECTRONIC modulation, ELECTRIC potential, AVALANCHE photodiodes, SIGNAL processing
Abstract

Photon-counting optical time domain reflectometry (v-OTDR) is typically used in a mode with spatial resolution in the centimeter range. Here we demonstrate a 1550nm v-OTDR system to optimize the discriminate voltage of a single photon avalanche detector using a single photon modulation and demodulation technique, which shows obvious improvement in the signal intensity. The intensity of signal is doubled when the discriminator voltage is optimized from 184 mV to 162 mV. [ABSTRACT FROM AUTHOR]

Published
2011
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