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The preparation of 80 nm, 140 nm, and 200 nm La 2 Zr 2 O 7 (LZO) multilayers on biaxially textured Ni-5 at% W (Ni5W) substrates using chemical solution deposition (CSD) was studied. The performance of multilayers was studied by means of X-Ray Diffraction (XRD), Electron Back Scattering Diffraction (EBSD), and Auger Electron Spectrometry (AES). The as-grown buffer layers exhibit sharp texture with texture components (0°−10°) about 96.7%, 98.9%, and 98.8%, respectively. The full-width at half maximum (FWHM) values of the ω-scans decreases with the number of layers, close to that of Ni5W substrates. The films exhibit dense, smooth, crack-free surface with a roughness Ra 3–5 nm, and sufficient barrier function against metal ionic diffusion from Ni5W substrates into buffer layers. The performance of LZO multilayers was confirmed by YBa 2 Cu 3 O 7−x (YBCO) films deposited by CSD technology.

A thorough study of the growth and characterization of La 2 Zr 2 O 7 (LZO) buffer layers prepared by chemical solution deposition on Ni–5 at% W biaxially textured substrates is presented. The main focus is to understand the processes of film growth, texture evolution, and lattice misorientation during heat treatment to obtain biaxially textured LZO buffer layers with a high degree of texture. We report a systematic investigation of LZO film growth with varying cation concentrations and processing temperatures. 45° rotated misorientation crystallization is found to coexist with the cube-on-cube orientation and maybe partially formed by the transformation of the cube-on-cube orientation with increasing annealing temperature. The texture component improves with increasing surface crystallinity. These epitaxially grown LZO buffer layers have a dense and smooth structure and a texture component of 98–99%.