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Analytical expressions are formulated that enable the lognormal distribution of nanocrystallite sizes and the mean-squared crystal lattice microstrain in both doped and undoped nanocrystalline ceramics to be routinely determined by X-ray diffractometry. Importantly, these expressions, which are also applicable to most well-annealed nanocrystalline metals/alloys, are developed under the consideration that both the experimental and instrumental X-ray diffraction peaks are modeled by split Voigt functions to account for the (hitherto widely ignored) intrinsic peak asymmetry. The general analytical expressions of this new single-peak line-broadening method are then particularized to the case of small nanocrystallites with uniform composition for which a reasonable simplification (i.e., symmetrization of the experimental peak) can be made without compromising the accuracy of the results. Next, as an example of application the method developed is applied to the characterization of a nanocrystalline ceramic powder, and the nanocrystallite sizes so-determined are validated by transmission electron microscopy. The more complete and reliable microstructural information offered by this single-peak line-broadening method could contribute towards the accurate characterization of both doped and undoped nanocrystalline ceramics, and of most well-annealed nanocrystalline metals/alloys as well, a topic of particular research interest today.

A wide set of 3 mol% Y2O3-stabilized ZrO2 (3YSZ) powders have been synthesized by the sol–gel method without modifiers from solutions of zirconium n-propoxide and yttrium acetate prepared with different water/Zr molar ratio and zirconium concentration, and the effect of these two synthesis variables on the pressureless sinterability of the 3YSZ powders has been investigated. It was found that the sinterability increases with increasing zirconium concentration and water/Zr molar ratio, which is attributed to the smaller cluster size developed during the sol–gel synthesis. Implications for the preparation of more sinterable 3YSZ powders are discussed Fil: Mamana, Nadia. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina Fil: Ortiz, Angel L.. Universidad de Extremadura. Badajoz; España Fil: Sánchez Bajo, Florentino. Universidad de Extremadura. Badajoz; España Fil: Caruso, Ricardo. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Rosario. Instituto de Física de Rosario. Universidad Nacional de Rosario. Instituto de Física de Rosario; Argentina

The accuracy of the Rietveld method in determining the lattice parameters of polytypes in multiphase SiC ceramics was investigated as a function of the polytype composition and of the polytype crystallite size, using as benchmarks two sets of standard X-ray diffraction (XRD) patterns obtained by computer simulation. It was found that the Rietveld method is remarkably accurate, but also that the measurement of lattice parameters is sensitive to the polytype composition and to the polytype crystallite size. In particular, the accuracy of Rietveld-calculated lattice parameters for a given polytype not only decreases with increasing number of polytypes in the SiC ceramics, but also depends on which other polytypes are present. These two findings are interpreted based on the severity of the corresponding peak overlap phenomenon in the XRD patterns. In addition, the accuracy of the Rietveld analyses also decreases with decreasing crystallite size of the polytypes, which is due to the progressive loss of definition in the location of the peak maxima and to the greater severity of the peak overlap, both resulting from the corresponding peak broadening. This identification of the confidence limits of the Rietveld-calculated lattice parameters for a wide range of microstructural features may have important implications for the future characterization of SiC ceramics by XRD.