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1. Wet-sample scanning electron microscope.

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *NEW product development, *SCIENTIFIC apparatus & instruments
Abstract

Presents a product review of ISI's scanning electron microscope (SEM) that eliminates the need for many sample preparation steps such as fixing, dehydrating, critical point drying and coating. Operation of the Wet-SEM; Features of the instrument.

Published
1989

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