1. Aethalometer multiple scattering correction Cref for mineral dust aerosols.
- Author
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Di Biagio, Claudia, Formenti, Paola, Cazaunau, Mathieu, Pangui, Edouard, Marchand, Nicholas, and Doussin, Jean-François
- Subjects
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MINERAL dusts , *AIR pollution measurement ,ENVIRONMENTAL aspects - Abstract
In this study we provide a first estimate of the aethalometer multiple scattering correction Cref for mineral dust aerosols. The Cref at 450 and 660?nm was obtained from the direct comparison of aethalometer data (Magee Sci. AE31) with the absorption coefficient calculated as the difference between the extinction and scattering coefficients measured by a CAPS PMex and a nephelometer at 450?nm and the absorption coefficient from a MAAP (Multi-Angle Absorption Photometer) at 660?nm. Measurements were performed on seven dust aerosol samples generated in the laboratory by the mechanical shaking of natural parent soils issued from different source regions worldwide. The single scattering albedo (SSA) at 450 and 660?nm and the size distribution of the aerosols were also measured. Cref for mineral dust varies between 1.81 and 2.56 for a SSA of 0.85-0.96 at 450?nm and between 1.75 and 2.28 for a SSA of 0.98-0.99 at 660?nm. The calculated mean Cref for dust is 2.09 (±?0.22) at 450?nm and 1.92 (±?0.17) at 660?nm. With this new Cref the dust absorption coefficient by aethalometer is about 2?% (450?nm) and 11?% (660?nm) higher than that obtained by using Cref?=?2.14, usually assumed in the literature. This difference induces up to 3?% change in the dust SSA. The Cref seems independent of the particle fine and coarse size fractions, and so the obtained Cref can be applied to dust both close to sources and following transport. Additional experiments performed with pure kaolinite mineral and polluted ambient aerosols indicate a Cref of 2.49 (±?0.02) and 2.32 (±?0.01) at 450 and 660?nm (SSA?=?0.96-0.97) for kaolinite, and a Cref of 2.32 (±?0.36) at 450?nm and 2.32 (±?0.35) at 660?nm for pollution aerosols (SSA?=?0.62-0.87 at 450?nm and 0.42-0.76 at 660?nm). [ABSTRACT FROM AUTHOR]
- Published
- 2017
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