1. Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry
- Author
-
Wehbe, Nimer, Delcorte, Arnaud, Heile, Andreas, Arlinghaus, Heinrich F., and Bertrand, Patrick
- Subjects
- *
SECONDARY ion mass spectrometry , *TIME-of-flight mass spectrometry , *ION bombardment , *MOLECULAR models , *SURFACE energy , *SPUTTERING (Physics) , *IONIZATION (Atomic physics) , *GOLD - Abstract
Abstract: Static ToF-SIMS was used to evaluate the effect of gold condensation as a sample treatment prior to analysis. The experiments were carried out with a model molecular layer (Triacontane M =422.4Da), upon atomic (In+) and polyatomic (Bi3 +) projectile bombardment. The results indicate that the effect of molecular ion yield improvement using gold metallization exists only under atomic projectile impact. While the quasi-molecular ion (M+Au)+ signal can become two orders of magnitude larger than that of the deprotonated molecular ion from the pristine sample under In+ bombardment, it barely reaches the initial intensity of (M−H)+ when Bi3 + projectiles are used. The differences observed for mono- and polyatomic primary ion bombardment might be explained by differences in near-surface energy deposition, which influences the sputtering and ionization processes. [Copyright &y& Elsevier]
- Published
- 2008
- Full Text
- View/download PDF