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Start Over Author "Truchly, M." Journal applied surface science
5 results on '"Truchly, M."'

5. Studies of resistance switching effects in metal/YBa2Cu3O7−x interface junctions

Author

Plecenik, A., Tomasek, M., Plecenik, T., Truchly, M., Noskovic, J., Zahoran, M., Roch, T., Belogolovskii, M., Spankova, M., Chromik, S., and Kus, P.

Subjects
*THIN films, *METALLIC oxides, *ELECTRIC resistance, *INTERFACES (Physical sciences), *SUPERCONDUCTIVITY, *ELECTRODES, *TEMPERATURE effect, *SCANNING tunneling microscopy
Abstract

Abstract: Current–voltage characteristics of planar junctions formed by an epitaxial c-axis oriented YBa2Cu3O7−x thin film micro-bridge and Ag counter-electrode were measured in the temperature range from 4.2K to 300K. A hysteretic behavior related to switching of the junction resistance from a high-resistive to a low-resistive state and vice-versa was observed and analyzed in terms of the maximal current bias and temperature dependence. The same effects were observed on a sub-micrometer scale YBa2Cu3O7−x thin film–PtIr point contact junctions using Scanning Tunneling Microscope. These phenomena are discussed within a diffusion model, describing an oxygen vacancy drift in YBa2Cu3O7−x films in the nano-scale vicinity of the junction interface under applied electrical fields. [Copyright &y& Elsevier]

Published
2010
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