Author: "Takenaka, H." / Journal: applied surface science - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Takenaka, H."' showing total 4 results

Start Over Author "Takenaka, H." Journal applied surface science

4 results on '"Takenaka, H."'

1. Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin test

Author: Toujou, F., Yoshikawa, S., Homma, Y., Takano, A., Takenaka, H., Tomita, M., Li, Z., Hasegawa, T., Sasakawa, K., Schuhmacher, M., Merkulov, A., Kim, H.K., Moon, D.W., Hong, T., and Won, J.-Y.
Published: 2004
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2. Evaluation of SIMS depth resolution using delta-doped multilayers and mixing–roughness-information depth model

Author: Takano, A., Homma, Y., Higashi, Y., Takenaka, H., Hayashi, S., Goto, K., Inoue, M., and Shimizu, R.
Published: 2003
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3. SIMS study of depth profiles of delta-doped boron/silicon alternating layers by low-energy ion beams

Author: Hayashi, S., Takano, A., Takenaka, H., and Homma, Y.
Published: 2003
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4. Auger electron spectroscopy measurement of electron attenuation lengths using multilayer systems

Author: Suzuki, M., primary, Mogi, K., additional, and Takenaka, H., additional
Published: 1996
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