7 results on '"Nojima M"'
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2. Highly accurate shave-off depth profiling by simulation method
3. Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometry
4. Introduction of ice protective film for 3D microscale analysis of biological sample
5. Shave-off depth profiling: Depth profiling with an absolute depth scale
6. Evaluation of the nano-beam SIMS apparatus
7. Nanoscale SIMS analysis: the next generation in local analysis
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