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The lifetimes of a series of N-related photoluminescence lines (A2–A6) in GaAs1-xNx (x=0.1%) were studied under hydrostatic pressures at ∼30 K. The lifetimes of A5 and A6 were found to increase rapidly with increasing pressure: from 2.1 ns at 0 GPa to more than 20 ns at 0.92 GPa for A5 and from 3.2 ns at 0.63 GPa to 10.8 ns at 0.92 GPa for A6. The lifetime is found to be closely correlated with the binding energy of the N impurity states, which is shown either in the pressure dependence for a given emission line or in the lifetime variation from A2 to A6. [ABSTRACT FROM AUTHOR]

Exciton localization in Te-rich ZnSTe epilayers has been studied by photoluminescence (PL) and time-resolved PL. The sulfur-related exciton emission is found to dominate the radiative recombination at low temperature and is shifted to the low energy with the increase of S concentration. By measuring the PL dependence on temperature and by analyzing the PL decay process, we have clarified the localization nature of the sulfur-related exciton emission. Furthermore, the difference of the localization effect in Te- and S-rich ZnSTe is also compared and discussed. [ABSTRACT FROM AUTHOR]