1. Growth and characterization of thick oriented barium hexaferrite films on MgO (111) substrates
- Author
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C. Vittoria, M. L. Chen, S. D. Yoon, Steven A. Oliver, and I. Kozulin
- Subjects
Diffraction ,Laser ablation ,Materials science ,Physics and Astronomy (miscellaneous) ,Magnetometer ,Film plane ,Epitaxy ,Pulsed laser deposition ,law.invention ,Nuclear magnetic resonance ,law ,X-ray crystallography ,Composite material ,Microwave - Abstract
Highly oriented films of BaFe12O19 have been deposited onto MgO (111) substrates by pulsed laser ablation deposition. In contrast to epitaxial BaFe12O19 films grown on Al2O3 (001) substrates, these films experience an in-plane biaxial compressive stress, and do not crack or delaminate to thicknesses of at least 28 μm. X-ray diffraction, magnetometry, torque magnetometry, and ferrimagnetic resonance results all indicate excellent c-axis orientation normal to the film plane, and magnetic properties comparable to bulk values. The thickness and properties of these films approach those required for applications in low-loss self-biased nonreciprocal microwave devices.
- Published
- 2000
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