1. Thermal stability and phase transformation of α-, κ(ε)-, and γ-Ga2O3 films under different ambient conditions.
- Author
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Tang, Jingyu, Jiang, Kunyao, Tseng, Po-Sen, Kurchin, Rachel C., Porter, Lisa M., and Davis, Robert F.
- Subjects
PHASE transitions ,SCANNING electron microscopy ,THERMAL stability ,X-ray diffraction ,NITROGEN - Abstract
Phase transitions in metastable α-, κ(ε)-, and γ-Ga
2 O3 films to thermodynamically stable β-Ga2 O3 during annealing in air, N2 , and vacuum have been systematically investigated via in situ high-temperature x-ray diffraction (HT-XRD) and scanning electron microscopy (SEM). These respective polymorphs exhibited thermal stability to ∼471–525 °C, ∼773–825 °C, and ∼490–575 °C before transforming into β-Ga2 O3 , across all tested ambient conditions. Particular crystallographic orientation relationships were observed before and after the phase transitions, i.e., (0001) α-Ga2 O3 → ( 2 ¯ 01) β-Ga2 O3 , (001) κ(ε)-Ga2 O3 → (310) and ( 2 ¯ 01) β-Ga2 O3 , and (100) γ-Ga2 O3 → (100) β-Ga2 O3 . The phase transition of α-Ga2 O3 to β-Ga2 O3 resulted in catastrophic damage to the film and upheaval of the surface. The respective primary and possibly secondary causes of this damage are the +8.6% volume expansion and the dual displacive and reconstructive transformations that occur during this transition. The κ(ε)- and γ-Ga2 O3 films converted to β-Ga2 O3 via singular reconstructive transformations with small changes in volume and unchanged surface microstructures. [ABSTRACT FROM AUTHOR]- Published
- 2024
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