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We have detected nuclear magnetic resonance in GaAs by selectively inverting 71Ga spins to create a local force gradient which shifts the mechanical resonance frequency of a nearby magnet tipped microcantilever. Employing a low spring constant cantilever (60 μN/m) at 4.4 K and 7 T, we demonstrate a magnetic moment sensitivity of 7.5×10−21 J/T, equal to the Curie Law magnetization from 7.1×108 71Ga spins. The method obviates the need to spin-lock sample magnetization during detection, allowing the signal to be collected for a time approaching the full spin-lattice relaxation time.

We measure the spin-lattice relaxation time as a function of sample temperature in GaAs in a real-time single-shot inversion recovery experiment using spin force gradients acting on a magnetic tipped cantilever. After inverting 69Ga spins localized near the magnet with a single 20 ms adiabatic rapid passage sweep, the spins’ magnetization recovery was passively tracked by recording the cantilever’s frequency change, which is proportional to the longitudinal component of the spins’ magnetization. The cantilever’s frequency was recorded for a time 3*T1 for sample temperatures ranging from 4.8 to 25 K. The temperature dependence was observed for the 69Ga quadrupolar relaxation interaction.

To date, magnetic-resonance force microscopes employing a magnetic-field gradient source mounted to a microcantilever have suffered from a deleterious dependence of the effective cantilever spring constant on the external magnetic field. A “magnet-on-tip” configuration is introduced in which this dependence has been decreased by at least 200 fold, making it feasible to perform arbitrary-sample micron-scale magnetic resonance force microscopy at very high magnetic field. Alternating-gradient cantilever magnetometry is used to quantify the effect and to prove that the existing model of the tip-field interaction is only qualitatively correct. A model is proposed which quantitatively describes the tip-field interaction in the traditional tip configuration.

We introduce and demonstrate a method of measuring small force gradients acting on a harmonic oscillator in which the force-gradient signal of interest is used to parametrically up-convert a forced oscillation below resonance into an amplitude signal at the oscillator’s resonance frequency. The approach, which we demonstrate in a mechanically detected electron spin resonance experiment, allows the force-gradient signal to evade detector frequency noise by converting a slowly modulated frequency signal into an amplitude signal.