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2. Energy loss due to defect formation from 206Pb recoils in SuperCDMS germanium detectors

5. Energy loss due to defect formation from 206Pb recoils in SuperCDMS germanium detectors.

6. Publisher’s Note: “Attainment of low interfacial trap density absent of a large midgap peak in In0.2Ga0.8As by Ga2O3 (Gd2O3) passivation” [Appl. Phys. Lett. 98, 062108 (2011)]

8. High-performance self-aligned inversion-channel In0.53Ga0.47As metal-oxide-semiconductor field-effect-transistors by in-situ atomic-layer-deposited HfO2.

9. Perfecting the Al2O3/In0.53Ga0.47As interfacial electronic structure in pushing metal-oxide-semiconductor field-effect-transistor device limits using in-situ atomic-layer-deposition.

10. Unidirectional threshold resistive switching in Au/NiO/Nb:SrTiO3 devices.

15. Electronic properties of the diamond films with nitrogen impurities: An x-ray absorption and photoemission spectroscopy study

19. Interband transitions and dielectric functions of InGaSb alloys

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